At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

A new technical paper titled “Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level Packaging” was published by researchers at Arizona State University. “Fan-out ...

What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...

Acquisition integrates advanced "shift-left" Design for Test (DFT) functionality into Siemens' Xpedition and Valor portfolios ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

Pipeline defect analysis and assessment remains a critical area of research, given its direct impact on the safety and reliability of energy transportation infrastructures. Mechanical defects such as ...

Örebro researchers Rajesh Patil and Professor Magnus Löfstrand have developed an AI system that detects welding defects, ...

As technology nodes shrink, end users are designing systems where each chip element is being targeted for a specific technology and manufacturing node. While designing chip functionality to address ...

The approach toward software testing has drastically changed over the years. It has changed from manual testing to automation frameworks and now to AI-based testing. It isn’t just about increasing ...

The system, developed by Panevo, a Canadian clear technology and manufacturing analytics company, reportedly achieved approximately 97% detection reliability with minimal false positives of Muskoka’s ...