For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

Each new manufacturing process generation brings with it a whole new set of challenges. In an era of multimillion-gate complexity and increasing density of nanometer manufacturing defects, a key ...

Test compression technology was invented to address the problem of escalating test-pattern size. Compression allows more test vectors to be applied to an IC in a shorter time and with fewer tester ...

Testing can represent as much as half the cost of semiconductor device manufacture. To reduce that, Mentor Graphics' TestKompress uses a new compression technology that lets designers cut the amount ...

Despite how complex many modern vehicles are, you can do many common repair and maintenance jobs yourself even if you only ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...