In semiconductor manufacturing, especially in electrical test data, but also in other parameters, there are often sets of parameters that are very highly correlated. Even a change in the correlation ...

1. Aspects of multivariate analysis -- 2. Matrix algebra and random vectors -- 3. Sample geometry and random sampling -- 4. The multivariate normal distribution -- 5. Inferences about a mean vector -- ...

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.