Schematic diagram of the method for directly visualizing defects in 2D semiconductors. (Courtesy: G Zhang) Directly visualizing structural defects in semiconductors on large scales is no easy task.

As semiconductor technology scales down in size, process integration complexity and defects are increasing in 3D NAND flash, partially due to larger stack deposits and thickness variability between ...

Phosphorene, a recently developed two-dimensional (2D) material, has attracted tremendous interest because of its unique properties, including its anisotropic nature 1,2,3,4,5,6,7; its layer-dependent ...

Reducing defects on the wafer edge, bevel, and backside is becoming essential as the complexity of developing leading-edge chips continue to increase, and where a single flaw can have costly ...

The semiconductor industry thrives on precision and innovation, as every nanometer can make the difference between groundbreaking performance and obsolescence. In this hyper-competitive landscape, ...

The Nature Index 2025 Research Leaders — previously known as Annual Tables — reveal the leading institutions and countries/territories in the natural and health sciences, according to their output in ...

The quality of substrate materials determines the reliability and performance of SiC chips. However, the number of defects and distributions of the substrate crystal can only be inspected by sampling ...

The semiconductor manufacturing industry is seeing a dramatic increase in the demand for probe-mark inspection, driven primarily by the introduction of multiple die packages, the adoption of new ...

The Global Semiconductor Etch Equipment Market revenue was USD 22730 Million in 2022 and is forecast to a readjusted size of ...