Veryon has been named a winner in the 2026 BIG Innovation Awards for Veryon AIRE, its AI-powered data intelligence platform, ...

What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...

Korean researchers have developed a new analysis method capable of detecting “hidden defects” in semiconductors with a ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

In addition to surface and subsurface defects, residual stress represents a concern. Over time, these stress points, ...

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...

A joint research team has successfully identified, for the first time, the specific types of defects responsible for efficiency loss in silicon heterojunction (SHJ) solar cells. Subscribe to our ...