The Design-for-Test (DFT) methodology is a strong driving force in the cost-effective testing of large-volume commodity items with very short life cycles, like system-on-chip (SoC) devices. It will ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

BALTIMORE — The marriage of design-for-test (DFT) software with test hardware may drastically lower the cost of test, according to several companies that will present their plans at this week's ...

Asset InterTech has announced its DFT Analyzer, which according to the company reduces manufacturing and test costs by validating the boundary-scan design-for-test features in a circuit-board design ...

The dramatic rise in manufacturing test time for today’s large and complex SoCs is rooted in the use of traditional approaches to moving scan test data from chip-level pins to core-level scan channels ...

To meet the increasing size of ICs, required to accommodate the integration of billions of transistors in order to deliver the performance required for tasks such as AI and autonomous vehicles, Mentor ...

Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...